High-Speed Digital I/O Applications

Using the NI 655x for Logic Analyzer Applications
During the process of debugging and validating a digital system, a common task is the acquisition of digital waveforms. With the logic analyzer tool, you can acquire numerous digital waveforms simultaneously. The acquisition can be clocked internally, or the system under test (SUT) can provide the sample clock. A logic analyzer also supports multiple triggering schemes to determine when data is acquired.

Testing Protection/Clamp Diodes with the NI 655X Digital Waveform Generator/Analyzer
Most integrated circuits (ICs) and electronic devices require circuit protection from voltage spikes, surges, electrostatic discharge (ESD), and other overvoltage conditions. The most common way to provide this protection is with a clamp diode. This application note describes how to use the NI 655X with LabVIEW and NI-HSDIO to test for the presence of such diodes in a functional circuit. Using the method described below, you can test up to 20 channels (40 diodes) simultaneously.

Voltage Tests and Open and Short Tests Using High-Speed Digital Devices
Part of testing the parametrics of an integrated circuit includes voltage or open and shorts tests. Learn how to use the high-speed digital devices to implement voltage or open and short tests.