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NI PXI分立元器件测试系统

对晶体管、二极管和无源器件进行特征记述

配置页面以便: 打印 通过Word格式查看
  • 测量FET、BJT、MOSFET和其它晶体管的电压和电流特征
  • 扫描I-V弧线跟踪, 以1 nA的分辨率编程选择从-20 V到20 V不等的电压范围
  • 对电阻、电感和电容进行特征记述
  • 检查电容和电感的瞬态响应
  • 检查二极管的开路/短路和电流泄漏
  • 将DC仪器路由至多个测试点
配置完整的PXI系统

NI提供的各种产品，可在验证、特性化和生产环境中设计半导体测试系统。PXI平台提供的紧凑零占地(zero-footprint)测试系统，结合模块化仪器与高级定时和同步技术，可实现直流到6.6 GHz的多项测量。

NI PXI分立元器件测试系统包含的重要仪器，能够对晶体管、二极管、电阻、电容、电感和其它无源器件进行完整的特征记述。系统中，任意波形发生器可生成模拟测试模式，源测量单元(SMU)适合曲线跟踪和测量瞬态响应，数字万用表(DMM)适合电感与电容测量，开关模块能够将DC仪器路由至多个测试点。

NI PXI分立元器件测试系统解决方案提供的仪器，适合进行分立元器件上的常见测量（如：I-V弧线跟踪、电阻、电容与电感特征记述）。结合NI LabVIEW软件的这个方法可快速自定义用户系统，继而引入测量帮助用户对特定的分立元器件进行特征记述。借助NI系统工程师编写的实例程序快速启动并运行，实现元器件特征记述中至关重要的常见测量。

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NI PXI分立元器件测试系统
套件内容

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Analog Instrumentation
Select products for measuring the output of a DAC
14-bit, 100 MS/s Digitizer (PXIe-5122) 779967-02
2 simultaneously sampled channels with 100 MHz of bandwidth with noise and antialias filters

DC Parametric Measurements
Select products for open/shorts, leakage, power consumption, and other DC measurements
Source Measure Unit (PXI-4130) 779647-31
Four quadrant source/measure capability, down to 1 nA sensitivity
Programmable Power Supply (PXI-4110) 779647-11
Three channel output: +20V, -20V, +6V, down to uA sensitivity

Probing and Custom Measurements
Probe test points and take individual voltage and current measurements with a digital multimeter
6½-digit Flexible Resolution DMM and LCR Meter (PXI-4072) 778270-01
Precision capacitance and inductance measurement capability with 10-23 bit resolutions

Switching / Connectivity
Select products for connecting DC instrumentation to multiple test points
544-Crosspoint FET Matrix Switch (PXI-2536) 778572-36
8x68 (1-wire) matrix configuration with unlimited switch lifetime

Software
Select a software package to develop your application or manage your test suite
TestStand Dev. System, Windows, Include 1 Year SSP 777777-35
Automate the characterization of your IC when taking multiple measurements and manage instrument resources to optimize test times. Develop, manage, and execute test sequences written in any programming language with custom reporting to summarize your test results.
LabVIEW Professional Development System, Windows, Include 1 Year SSP 776678-35
Develop intuitive user interfaces for your characterization test station, and create custom test applications with graphical programming. Extract useful information from your data with interactive wizards and more than 500 built-in LabVIEW measurement analysis and signal processing functions.
LabVIEW/Chinese Professional Development System, Windows, Include 1 Year SSP 776678-3518
Develop intuitive user interfaces for your characterization test station, and create custom test applications with graphical programming. Extract useful information from your data with interactive wizards and more than 500 built-in LabVIEW measurement analysis and signal processing functions.

机箱
8-Slot 3U PXI Express Chassis (PXIe-1062Q) 779633-01
4 PXI slots, 2 PXI Express hybrid slots, and 1 PXI Express system timing slot

控制器
PXI Express Embedded Controller (Windows XP) 779920-01
2.16 GHz Intel Core 2 Duo T7400 dual-core processor with up to 1 GB/s system bandwidth
PXI Express Embedded Controller (Windows Vista) 779920-02
2.16 GHz Intel Core 2 Duo T7400 dual-core processor with up to 1 GB/s system bandwidth

交流电源线
Power Cord, AC, U.S., 120 VAC 763000-01
Power Cord, 240V, 10A, North American 763068-01

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