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NI PXI数模转换器 (DAC)测试系统

对16位, 200 MS/s的DAC进行特征记述

配置页面以便: 打印 通过Word格式查看
  • 模拟捕捉时的分辨率和采样率从24位500 kS/s到16位15 MS/s不等
  • 配有各种电压范围、达200 MHz的数字I/O, 适合DAC模式生成
  • ±20 V、2 A电源/测量功能, 可实现敏感度低达1 nA的参数测量
  • 将DC仪器路由至多个测试点
  • 生成数字测试模式, 用于INL/DNL、SINAD、SNR、THD……
  • 借助SPI、I2C、JTAG等常规数字协议, 控制DAC操作
配置完整的PXI系统

NI提供的各种产品，可在验证、特性化和生产环境中设计半导体测试系统。PXI平台提供的紧凑零占地(zero-footprint)测试系统，结合模块化仪器与高级定时和同步技术，可实现直流到6.6 GHz的多项测量。

NI PXI数模转换器(DAC)测试系统包含的重要仪器，可对配有最高16位分辨率和200 MS/s采样率的DAC进行完整特征记述。系统中，高速数字I/O可将测试模式生成至DAC并且生成常用通信协议（SPI、I2C、JTAG），数字化仪能够捕捉DAC的模拟输出，源测量单元(SMU)适合常用DC参数测量（开路/短路、泄漏测试），开关模块能够将DC仪器路由至多个测试点。

NI PXI DAC测试系统解决方案提供的仪器，既适合在DAC上进行常见测量（如：INL、DNL、SNR、THD、IDD、IDDQ），也适合进行电压高/低阈值测试。结合NI LabVIEW软件的这个方法可快速自定义用户系统，继而引入特定测量帮助用户对DAC进行特征记述。借助NI系统工程师编写的实例程序快速启动并运行，实现设计特征记述中至关重要的常见测量。

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NI PXI数模转换器 (DAC)测试系统
套件内容

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Analog Instrumentation
Select products for measuring the output of a DAC
14-bit, 100 MS/s Digitizer (PXIe-5122) 779967-02
2 simultaneously sampled channels with 100 MHz of bandwidth with noise and antialias filters
24-bit, 500 kS/s to 16-bit, 15 MS/s Digitzer (PXI-5922) 779153-02
High resolution digitizer with flexible sampling rates for high-resolution ADCs

Digital Instrumentation
Select products for capturing the output of an ADC, for standard/custom digital protocols (SPI, I2C, JTAG, etc)
100 MHz, Stimulus/Response, Bidirectional (PXI-6552) 778539-02
Programmable voltage levels from -2 to 5V for VOH, VOL, VIH, VIL (per board)
100 MHz, Selectable Voltage, High-Channel Count (PXI-6542) 778953-02
Select from 1.8, 2.5, and 3.3V logic levels
NI PXIe-6545 (200MHz, 32DIOch, 1.2, 1.5, 1.8, 2.5, 3.3V, 8Mb/ch) 780993-02

DC Parametric Measurements
Select products for open/shorts, leakage, power consumption, and other DC measurements
Source Measure Unit (PXI-4130) 779647-31
Four quadrant source/measure capability, down to 1 nA sensitivity
Programmable Power Supply (PXI-4110) 779647-11
Three channel output: +20V, -20V, +6V, down to uA sensitivity

Switching / Connectivity
Select products for connecting DC instrumentation to multiple test points
544-Crosspoint FET Matrix Switch (PXI-2536) 778572-36
8x68 (1-wire) matrix configuration with unlimited switch lifetime

Software
Select a software package to develop your application or manage your test suite
TestStand Dev. System, Windows, Include 1 Year SSP 777777-35
Automate the characterization of your IC when taking multiple measurements and manage instrument resources to optimize test times. Develop, manage, and execute test sequences written in any programming language with custom reporting to summarize your test results.
LabVIEW Professional Development System, Windows, Include 1 Year SSP 776678-35
Develop intuitive user interfaces for your characterization test station, and create custom test applications with graphical programming. Extract useful information from your data with interactive wizards and more than 500 built-in LabVIEW measurement analysis and signal processing functions.
LabVIEW/Chinese Professional Development System, Windows, Include 1 Year SSP 776678-3518
Develop intuitive user interfaces for your characterization test station, and create custom test applications with graphical programming. Extract useful information from your data with interactive wizards and more than 500 built-in LabVIEW measurement analysis and signal processing functions.

机箱
8-Slot 3U PXI Express Chassis (PXIe-1062Q) 779633-01
4 PXI slots, 2 PXI Express hybrid slots, and 1 PXI Express system timing slot

控制器
PXI Express Embedded Controller (Windows XP) 779920-01
2.16 GHz Intel Core 2 Duo T7400 dual-core processor with up to 1 GB/s system bandwidth
PXI Express Embedded Controller (Windows Vista) 779920-02
2.16 GHz Intel Core 2 Duo T7400 dual-core processor with up to 1 GB/s system bandwidth

交流电源线
Power Cord, AC, U.S., 120 VAC 763000-01
Power Cord, 240V, 10A, North American 763068-01

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