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Wireless Test System

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  • Ability to test multiple wireless standards with the same platform
  • RF vector signal analyzers for world-class measurement speed
  • Test systems capable of R&D-grade measurement accuracy
  • PXI platform flexibility for unique applications

National Instruments modular, software-defined RF instrumentation can help you design and test your wireless devices. This approach makes it possible for you to harness industry-standard PC technologies, such as multicore processors and the PCI Express bus, to dramatically reduce your test times. With software-defined instruments, you can test multiple wireless standards using one system. In addition, you can use the PXI platform modularity to easily integrate DC and mixed-signal measurements, switching, and RAID storage devices.