NI LabVIEW Jitter Analysis Toolkit

  • Automate and perform measurements using any oscilloscope or digitizer
  • Take advantage of thread-safe measurement acceleration when using multicore machines
  • Easily construct and display eye diagrams and bathtub curves
  • Enables eye mask definition and mask limit testing
  • Includes example programs for eye diagrams, mask testing, and RJ/DJ separation
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The NI LabVIEW Jitter Analysis Toolkit provides a library of functions optimized for performing the high-throughput jitter, eye diagram, and phase noise measurements demanded by automated validation and production test environments. Because it is hardware-agnostic, the toolkit can be used in a test system for automating measurements using any instruments, such as third-party oscilloscopes and digitizers or NI high-speed and high-resolution digitizers.

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Disclaimer: This example program (this "program") was developed by a National Instruments ("NI") Engineer. Although provided by National Instruments, this program may not be completely tested and verified, and NI does not guarantee its quality in any way or that NI will continue to support this program with each new revision of related products and drivers. THIS PROGRAM IS PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND SUBJECT TO CERTAIN RESTRICTIONS AS MORE SPECIFICALLY SET FORTH IN NI.COM'S TERMS OF USE (http://ni.com/legal/termsofuse/unitedstates/us/).