NI LTE Measurement Suite Test 3GPP Long Term Evolution Devices and Components

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  • Support for LTE-FDD and LTE-TDD UE and PA testing
  • Interactive soft front panel and LabVIEW/C/C++/.NET API
  • Residual EVM <-50 dB for 10 MHz bandwidth with NI PXIe-5665 vector signal analyzer (VSA)
  • Measurements 3X to 5X faster than traditional instruments
  • Supports NI PXIe-5644R/5645R, NI PXIe-5673E, NI PXIe-5663E, and NI PXIe-5665 (50 MHz version)
  • Single license for development or deployment
  • View Data Sheet  |  Specifications  
  • View Support Resources
The NI LTE Measurement Suite provides an API and interactive soft front panels for FDD/TDD UE and PA testing. The NI LTE Generation and Analysis toolkits operate with PXI RF signal generators and analyzers, delivering industry-leading measurement speed and R&D-grade measurement accuracy in the software-defined PXI platform.
Part Number Description Est Ship  US Dollars Qty
781581-35NI LTE Generation Toolkit for 3GPP LTE UE Testing5 - 10$ 6,334.00
781582-35NI LTE Analysis Toolkit for 3GPP LTE UE Testing5 - 10$ 6,334.00
781583-35NI LTE Measurement Suite for 3GPP UE Layer Testing5 - 10$ 8,446.00

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