- Fault insertion units (FIUs) available for simulating opens and shorts in electronic test systems
- The NI PXI-2510 offers 68 fault insertion channels with up to 150 V capacity
- The NI 2512 and 2514 offer 7 fault insertion channels with up to 10 A and 40 A capacity respectively
- The NI 2515 high-speed digital switch offers 35 I/O pass-through lines for clock rates up to 200 MHz
NI Signal Insertion Switches provide feedthrough channels that look transparent to an automated test system during normal operation. Each channel can then be disconnected from its normal path, and connected to a shared bus line.
With this architecture, NI offers fault insertion units (FIUs) that allow engineers to simulate or inject fault conditions into electronic systems. This technique is often used in hardware-in-the-loop (HIL) applications where an embedded controller must have a known and acceptable response to a fault condition. For semiconductor characterization applications, National Instruments offers the NI 2515 high-speed digital signal insertion switch, which can be used for parametric testing of digital pins. Visit the links at the left to navigate the options.