- Sampling rates as high as 2 GHz with 1 GHz of bandwidth and flexible resolutions up to 24 bits
- 6.6 GHz vector signal analyzers and generators (VSAs/VSGs) with software for multiple RF standards
- Up to 200 MHz digital I/O with various voltage levels for pattern generation/acquisition
- ±20 V, 2 A source/measure capability for parametric measurements down to 1 nA sensitivity
- Several switch options for routing DC instrumentation to multiple test points
- Control chip operation through common digital protocols including SPI, I2C, and JTAG
National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
With more than 1,500 modules offered by more than 70 vendors, PXI instrumentation is ideal for testing semiconductor devices including analog-to-digital converters (ADCs), digital-to-analog converters (DACs), power management ICs (PMICs), wireless ICs (RFICs), microelectromechanical (MEMS) devices, and discrete components.
Browse the links below to learn more about how National Instruments products are used for semiconductor test or to view PXI systems designed for testing different types of chips.
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