National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
The NI PXI Discrete Component Test System includes the key instruments you need to fully characterize transistors, diodes, resistors, capacitors, inductors, and other passive devices. The system incorporates an arbitrary waveform generator to generate analog test patterns, a source measure unit (SMU) for curve tracing and measuring transient response, a digital multimeter (DMM) for inductance and capacitance measurements, and a switch module to route DC instrumentation to multiple test points.
The PXI Discrete Component Test System solution features the instruments you need to take common measurements on discrete components including I-V curve traces, resistance, capacitance, and inductance characteristics. Combined with NI LabVIEW software, this solution can help you quickly customize your system to take the measurements you need to characterize your specific discrete component. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your components.