National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
The NI PXI Microelectromechanical (MEMS) Test System includes the key instruments you need to fully characterize MEMS accelerometers, gyroscopes, and microphones. The system incorporates a source measure unit (SMU) for common DC parametric measurements (open/shorts, leakage testing), a high-accuracy data acquisition module for precision sound and vibration measurements over large dynamic ranges, high-speed digital I/O to interface to the MEMS device via common communication protocols (SPI, I2C, JTAG), and a switch module to route DC instrumentation to multiple test points.
The PXI MEMS Test System solution features the instruments you need to take common measurements on MEMS devices including open/shorts, standby current, reference IDD, positive and negative continuity testing, leakage current, input and output logic thresholds, and dynamic measurements. Combined with NI LabVIEW software, this solution helps you quickly customize your system to take the specific measurements you need to characterize your MEMS device. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your design.