National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
The NI PXI Wireless IC (RFIC) Test System includes the key instruments you need to fully characterize power amplifiers, transceivers, IF receivers, RF front ends, modulators/demodulators, and other RFIC devices. The system incorporates a 6.6 GHz vector signal analyzer (VSA) and 6.6 GHz vector signal generator (VSG) for capturing or generating common RF standards (ZigBee, WLAN, WiMAX, and so on); a source measure unit (SMU) for common DC parametric measurements (open/shorts, leakage testing); high-speed digital I/O for capturing or generating digital baseband or controlling test modes on RFICs via common communication protocols (SPI, I2C, JTAG); and options to add digitizers, clock sources, power meters, and other RF equipment to meet your needs.
The PXI Wireless IC (RFIC) Test System solution features the instruments you need to take common measurements on RFIC devices such as error vector magnitude (EVM), carrier leakage, frequency offset, and so on and create custom modulation schemes (AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, QAM). Combined with NI LabVIEW software, this solution can help you quickly customize your system to take the specific measurements you need to characterize your wireless IC. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your design.
