National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
The NI PXI Power Management IC (PMIC) Test System includes the key instruments you need to fully characterize DC-DC converters, low-dropout regulators (LDOs), display drivers, and other power management devices. The system incorporates a source measure unit (SMU) for common DC parametric measurements (open/shorts, leakage testing), a high-accuracy digitizer and high-resolution arbitrary waveform generator for analog measurements, high-speed digital I/O to control PMIC test modes via common communication protocols (SPI, I2C, JTAG), and a switch module to route DC instrumentation to multiple test points.
The PXI PMIC Test System solution features the instruments you need to take common measurements on PMIC devices including open/shorts, standby current, converter efficiency, line and load regulation, and power supply rejection ration (PSRR). Combined with NI LabVIEW software, this solution can help you quickly customize your system to take the specific measurements you need to characterize your power management device. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your design.
