National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz.
The NI PXI Digital-to-Analog Converter (DAC) Test System includes the key instruments to fully characterize DACs with up to 16-bit resolution and 200 MS/s sampling rates. The system incorporates high-speed digital I/O to generate test patterns to the DAC as well as generate common communication protocols (SPI, I2C, JTAG), a digitizer to capture the analog output of the DAC, a source measure unit (SMU) for common DC parametric measurements (open/shorts, leakage testing), and a switch module to route DC instrumentation to multiple test points.
The PXI DAC Test System solution features the instruments you need to take common measurements on DACs including INL, DNL, SNR, THD, IDD, IDDQ, and voltage high/low threshold testing. Combined with NI LabVIEW software, this solution can help you quickly customize your system to take the specific measurements you need to characterize your DAC. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your design.
