The NI PXIe-6545 digital waveform generator/analyzer features 32 bidirectional channels clocked at a maximum of 200 MHz. The selectable voltage levels of 1.2, 1.5, 1.8, 2.5, and 3.3 V work with the most common logic levels and are ideal for conducting tests on semiconductor devices, such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), ASICs, and microcontrollers. For example, with a 16-bit, parallel interface, 200 MS/s dual-channel DAC, you can use the NI PXIe-6545 to generate data on 32 lines (continuously or in bursts) to test the DAC at its maximum clock rate. You can also pair this device with other NI modular instruments, including digitizers or source measure units (SMUs), to characterize the DAC for various tests at higher rates.
Streaming rates of 660 MB/s to host PC memory and 400 MB/s from host PC memory make the NI PXIe-6545 ideal for applications requiring high streaming rates. You can use this module to stream high-definition digital video signals for generation or acquisition and to test LCD screens, television components, high-definition signals (up to 1080 p at 60 Hz), RF baseband devices, and HD radio.
The NI PXIe-6545 also features enhanced timing and synchronization capabilities. The onboard DDS clock provides subhertz resolution up to 200 MHz, helping you clock data (generation or acquisition) with higher precision without using an external clock. In addition, you can now test applications requiring arbitrary clock frequencies and export the onboard clock to other instruments through the backplane of a PXI Express chassis or through an SMB connector on the front panel of the device. Additionally, you can clock your data by importing an external clock through the front panel or backplane. With these features, you can synchronize the NI PXIe-6545 with other analog or digital instruments.
Reduce your setup time and total cost of ownership, and get a system you can use out of the box with National Instruments system assurance programs. System assurance programs include:
Installation and integration test of all individual hardware
Courtesy installation of system driver sets and application development environments
Extended warranty and calibration coverage for up to five years
Custom documentation plus a custom restore and startup utility
This service is only available for PXI, NI CompactRIO, and NI Compact FieldPoint systems.
National Instruments designs and manufactures all products to minimize failures, however unexpected failures can still occur. Extended warranties provide a fixed economical price at the time of system purchase, covering any repair costs for up to three years. In addition, they offer the following benefits:
Significant cost savings compared to individual repair incidents
Fault location, diagnostics, and repair by NI any time the system product fails
All parts and labor costs covered as well as any adjustments needed to restore the hardware to manufacturing specifications
NI recognizes the need to maintain properly calibrated devices for high-accuracy measurements. NI provides manual calibration procedures, services to recalibrate your products, and automated calibration software to calibrate many NI measurement products.
Return your registered product under warranty at no additional labor and parts cost. NI offers fault location, diagnostics, and repair any time the system fails as well as any adjustments needed to restore the hardware to manufacturing specifications.
Consumer demand for next-generation multimedia devices such as set-top boxes, Blu-ray players, HDTVs, gaming consoles, and mobile devices is challenging engineers to get these devices to market faster. National Instruments provides a wide range of measurement and automation tools built on flexible, industry-proven platforms that can help engineers meet this challenge from multimedia device design to production. Register for each event to learn how engineers are testing the latest video standards
Multimedia Device Test Web Event Series March 23-25, 2010
Analog and Digital Video: 10 Measurements for Every Application
Understanding the measurements you need to make on analog and digital video signals is the most essential part of testing a multimedia device. Learn which measurements to implement and characteristics in video signals to watch for to identify defects and ensure a higher-quality product reaches your end customers. See engineers use these measurements to test the video interfaces of a Blu-ray player.
View the Webcast Tuesday, March 23, 11:00 a.m.-Noon CDT:
Video Test Application Development: Automating Measurements and Optimizing Test Speed
The greatest challenge in testing multimedia devices is creating automated applications to evaluate the various audio, video, and wireless technologies incorporated in these devices. Learn the key strategies that can help you test these technologies faster and achieve consistent, reliable results. Watch as engineers build an application from scratch for production test of set-top boxes.
View the Webcast Wednesday, March 24, 11:00 a.m.-Noon CDT
Digital Video Technologies: Streaming Video Analysis and 3D Video Testing
Consumer demand for higher-quality multimedia content challenges engineers to develop better test techniques to quantify video quality and measure codec artifacts. Advanced digital video technologies introduced by the HDMI 1.4 specification such as 3D video add levels of complexity to multimedia device testing that require engineers to rethink their traditional approaches. Learn techniques to test 3D video content and the challenges you may face when building applications to test this new technology. Also see engineers analyze high-definition video streams for artifacts introduced by the codec applied.
View the Webcast Thursday, March 25, 11:00 a.m.-Noon CDT:
