The NI PCI-5114 is a low-cost digitizer for high-speed applications. It features a wide set of input ranges from 40 mV to 40 V, software-selectable 50 Ω or 1 MΩ input impedance, deep onboard memory up to 256 MB/channel, tight synchronization capability, and a wide variety of triggering options including HDTV video triggering. You can program more than 50 built-in measurement and analysis functions directly from the driver and expand them to more than 400 functions with NI LabVIEW and LabWindows™/CVI software.
The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
National Instruments designs and manufactures all products to minimize failures, however unexpected failures can still occur. Extended warranties provide a fixed economical price at the time of system purchase, covering any repair costs for up to three years. In addition, they offer the following benefits:
Significant cost savings compared to individual repair incidents
Fault location, diagnostics, and repair by NI any time the system product fails
All parts and labor costs covered as well as any adjustments needed to restore the hardware to manufacturing specifications
NI recognizes the need to maintain properly calibrated devices for high-accuracy measurements. NI provides manual calibration procedures, services to recalibrate your products, and automated calibration software to calibrate many NI measurement products.
Return your registered product under warranty at no additional labor and parts cost. NI offers fault location, diagnostics, and repair any time the system fails as well as any adjustments needed to restore the hardware to manufacturing specifications.
Consumer demand for next-generation multimedia devices such as set-top boxes, Blu-ray players, HDTVs, gaming consoles, and mobile devices is challenging engineers to get these devices to market faster. National Instruments provides a wide range of measurement and automation tools built on flexible, industry-proven platforms that can help engineers meet this challenge from multimedia device design to production. Register for each event to learn how engineers are testing the latest video standards
Multimedia Device Test Web Event Series March 23-25, 2010
Analog and Digital Video: 10 Measurements for Every Application
Understanding the measurements you need to make on analog and digital video signals is the most essential part of testing a multimedia device. Learn which measurements to implement and characteristics in video signals to watch for to identify defects and ensure a higher-quality product reaches your end customers. See engineers use these measurements to test the video interfaces of a Blu-ray player.
View the Webcast Tuesday, March 23, 11:00 a.m.-Noon CDT:
Video Test Application Development: Automating Measurements and Optimizing Test Speed
The greatest challenge in testing multimedia devices is creating automated applications to evaluate the various audio, video, and wireless technologies incorporated in these devices. Learn the key strategies that can help you test these technologies faster and achieve consistent, reliable results. Watch as engineers build an application from scratch for production test of set-top boxes.
View the Webcast Wednesday, March 24, 11:00 a.m.-Noon CDT
Digital Video Technologies: Streaming Video Analysis and 3D Video Testing
Consumer demand for higher-quality multimedia content challenges engineers to develop better test techniques to quantify video quality and measure codec artifacts. Advanced digital video technologies introduced by the HDMI 1.4 specification such as 3D video add levels of complexity to multimedia device testing that require engineers to rethink their traditional approaches. Learn techniques to test 3D video content and the challenges you may face when building applications to test this new technology. Also see engineers analyze high-definition video streams for artifacts introduced by the codec applied.
View the Webcast Thursday, March 25, 11:00 a.m.-Noon CDT:
