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Semiconductor
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  Title
07/10/2007 Research Group Creates Flexible, High-Speed, Mixed-Signal System for On-Wafer Function and Performance Testing
10/09/2006 Measuring the Power Cost of Processor Performance Using EEMBC EnergyBench and NI LabVIEW
06/30/2006 Using NI LabVIEW and PXI Modular Instruments for Automated Chip Characterization and Validation
01/18/2006 Designing a Highly Reliable Electron Beam Control System Using NI LabVIEW FPGA and CompactRIO
12/07/2005 Designing High-Speed Digital Tests for Military Defense Systems
08/10/2005 MPT nutzt PAC-Plattform von NI mit Motorensteuerungs- und Bildverarbeitungsprodukten für die Entwicklung eines Systems zum Ritzen von Wafern
01/28/2005 MPT Uses NI PAC Platform with Motion and Vision Products to Build Wafer Scriber
11/19/2004 NI TestStand Provides the Framework to Texas Instruments $4 Billion Division
03/07/2004 Automating Semiconductor Parametric Analysis
01/20/2004 Using NI-DAQ and LabVIEW to Construct a Prototype PC-Based Automated Optical Inspection System
07/30/2003 LabVIEW Reduces Wireless ASIC Device Characterization Report Generation Time
07/30/2003 Using LabVIEW and IMAQ Vision to Create High-Resolution Image Mosaics
07/30/2003 LabVIEW and FieldPoint Automate a Chemical Solution Concentration System
10/14/2002 Interference Lithography Tool Automates Grating Patterning for DFB Laser Manufacturing
10/14/2002 Ethernet Enabled AC Detector Test System
10/14/2002 Control System for Automated Production of Semiconductors
03/28/2002 LabVIEW and IMAQ Vision Builder Provide Automated Visual Test System
11/06/2001 Automation of Chemical Beam Epitaxial Wafer Manufacturing
08/11/2001 LabVIEW Helps Fabrication Process of Next Generation Microprocessors
10/03/2000 Intelligent Automation of Electron Beam Physical Vapor Deposition Using LabVIEW
08/16/2000 LabVIEW and IMAQ Control Production of Precision Alloy Microspheres
08/16/2000 PC-Based System Results in Faster Testing of Electronic Components
08/16/2000 PC-Based Automation of Keithley 610 Electrometer for Current-Voltage Measurements Using Lab-PC+
08/16/2000 Integrated Simulation and Hardware-Test Environment for Microcontroller Development
08/16/2000 Process Module Emulation using LabVIEW
03/05/1999 Using LabVIEW to Create Gas Sensor Characterization System
01/29/1999 Automated Silicon Wafer Measurement Using NI-IMAQ and LabVIEW
06/19/1998 Measuring the Thickness of Micromachined Silicon Wafers Using Machine Vision
08/06/1997 Real-Time In Situ Plasma Monitoring in Semiconductor Reactors
10/24/1996 Automated Testing of Analog Neural Network IC Devices Using NI LabVIEW