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STMicroelectronics Automates IC Validation Using NI LabVIEW and NI TestStand
Automating the characterization of complex ICs in a global design environment that consists of multiple teams with varying levels of test automation.
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Alstom Transport Standardizes Electronic Test with PXI Instrumentation, LabVIEW, and NI TestStand
Developing a flexible and scalable test bench that meets the manufacturing test needs of electronic products at the Alstom Transport site in Villeurbanne, France.
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Developing Test Systems for Automotive Multimedia Devices Using NI TestStand and PXI Hardware
Developing a test system for automotive multimedia systems that can perform multiple test operations for both DVD players and the associated display unity, and be easily altered to meet changing test parameters.
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Testing Flight Director Displays and Avionics Control Panels Using NI PXI Hardware
Testing Flight Director Displays and Avionics Control Panels Using NI PXI Hardware
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TestStand - Prüfschritt zur Steuerung eines Multifunktionsprüfsystems für die Elektronikfertigung
Der folgende Beitrag zeigt die Realisierung eines TestStand-Prüfschrittes, im folgenden StepType genannt, für ein Multifunktionsprüfsystem der MTU - Elektronikfertigung
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TestStand 4.0 – Testsysteme schneller aufgesetzt
Optimierung von NI TestStand 4.0 unter besonderer Betrachtung der Produktivität bei der Erstellung eines automatischen Testablaufs.
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G Systems 自動化測試公司使用 PXI 架構的 RF 與 GPS 共核生產測試作業
針對 3.5 GHz 天線傳輸器 (Subassembly) 與 GPS 追蹤模組 (Top assembly)，進行生產測試作業的自動化，並為海外製造廠最大化生產輸出的同時，亦要能最小化其整體成本。
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美國專業代工廠 Sanmina-SCI 使用 PXI Tester 與多執行緒軟體超越所預設的目標輸出率
開發精巧的高速功能測試工作台，並可同步校準 8 組醫療器材。
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Performing On-Wafer Testing with NI LabVIEW, NI TestStand, and PXI
Developing a reliable on-wafer test system for microelectromechanical system (MEMS) devices used for cardiac resynchronization therapy (CRT).
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PXI-Based RF and GPS Common Core Production Testing
Automating production test for both the 3.5 GHz satellite transceiver (subassembly) and GPS tracking modules (top assembly) to maximize production throughput while minimizing test system footprint and overall cost in overseas manufacturing.
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