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STMicroelectronics Automates IC Validation Using NI LabVIEW and NI TestStand
Automating the characterization of complex ICs in a global design environment that consists of multiple teams with varying levels of test automation.
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리노공업㈜ - 다채널 고속 저항 검사 장비 개선
기존 사용하던 장비의 신뢰성을 유지하면서 측정 효율을 200% 증가시키기 위해 개발하였다.
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Automatisierte Charakterisierung von Analog-Digital-Umsetzern
Entwicklung eines auf PXI basierten, fast vollautomatischen Messsystems zur Charakterisierung von Analog-Digital-Umsetzern mit höchster Performance.
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Protokollbasierter Halbleitertest
Aufbau einer modularen Testsystemplattform, welche die Anforderungen des modernen Halbleitertests erfüllt und der Vielfalt an Testherausforderungen gerecht wird
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美國半導體測試設備廠商 Credence Systems 使用 NI 模組化儀器擴充半導體測試的彈性
建立的測試解決方案必須能執行特定的高頻率量測，以符合多變的半導體應用需求。
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Interactive PCB- or Chip-Scale Thermal Visualization Tool
Developing an interactive graphical simulation in a printed circuit board (PCB) or semiconductor die that instantaneously computes a physics-based solution to the temperature/heat-flow equations in real time, permitting the user to dynamically reposition heat sources with a mouse and easily change
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Credence Systems Uses NI Modular Instruments to Extend Semiconductor Test Flexibility
Creating a test solution that performs specialized high-frequency measurements to meet diverse semiconductor application needs.
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Managing Multiple Types of DSP Processors Using NI TestStand
Developing a test solution that combines structural and functional tests and delivers high throughput, real-time test results, and data upload into MfG/PRO/Oracle to support multiple families of DSP processor modules.
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Applicazione della visione artificiale nell’industria dei semiconduttori
I due problemi affrontati sono: controllo del caricamento dei wafers in una macchina di produzione e il controllo di processo di attacco retro wafers. Nel primo caso il caricamento dei wafers in posizione errate nelle cassette provoca danni importanti. Nel secondo caso un processo errato intacca
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NI PXI-6552を駆使した高速ICテスターの開発
①セットアップ・ホールドタイム試験機能の実現②ファンクション試験機能の実現③高速かつ大量なデータパターンの出力機能の実現④DCパラメータの試験機能の実現
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