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宗臣科技採用 NI 虛擬儀控架構，開發 RFID 高速且客製化的產線量測技術
針對讀寫器及標籤之通訊訊號，同時進行物理量測，協定檢測並模擬所有讀取器或標籤之行為進行測試。此系統需具備產線整合能力，能和現有產線流程緊密結合。另外亦可產生專業報表及連結資料庫。
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B&B Technologies 進行 PXI 架構的 RF 元件測試系統 -- 適用於無線安全系統
開發一組系統，以測試由無線安全系統元件所傳輸的功率、頻率，與位元型樣 (Bit pattern)。測試系統將使用於製造廠房，以測試多種元件，並決定是否要接受合格率或不合格率。每天均可能執行數千種測試。
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Design of an Atomic Force Microscope using NI ELVIS and LabVIEW
Designing a cost-effective atomic force microscope (AFM) for nanotechnology research using commercially available parts and a widely accepted software package
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2 by 2 MIMO Discrete Multitone Transceiver Testbed
Prototyping the physical layer of a communications system to rapidly evaluate system design tradeoffs.
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Sistema di Test e Misura per Sistemi RF
Realizzare un sistema di test automatico da campo, comprendente un insieme di strumenti tipicamente utilizzati in laboratorio nell’ambito della manutenzione di apparati elettronici a radiofrequenza, in grado di effettuare test funzionali sul campo su sistemi RF.
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Using R Series Intelligent Data Acquisition for Bit-Error-Rate Test
Replacing traditional box instrumentation to support the testing of new and current product offerings.
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Using R Series Intelligent Data Acquisition for Bit-Error-Rate Test
Replacing traditional box instrumentation to support the testing of new and current product offerings.
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Cal-Bay Systems Delivers Advanced Software Architecture for Testing RF Amplifiers
Developing a cost-effective, rugged, and highly flexible test architecture to decrease test development time and increase test instrument interchangeability on the production floor for manufacturing and functional RF amplifier testing.
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Accelerating ZigBee and 802.15.4 Module Testing with National Instruments LabVIEW and the NI RF Vector Signal Analyzer
Improving throughput, repeatability, and accuracy in the current production test environment at MaxStream.
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Gemalto teste ses cartes à puce sans contact avec NI LabVIEW
Tester des cartes à puce en vérifiant de façon automatique l’intensité de leur communication par modulation RF selon la norme ISO10373-6, qui standardise les méthodes de test pour la caractérisation des cartes sans contact.
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