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Digital Broadcast Measurement Solution Based on NI PXI
Development of a flexible data acquisition and signal analysis solution for digital broadcast standards.
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Measuring Glacier Thickness in the Yukon with a Portable USB Digitizer
Characterizing glacier thickness using a cost-effective, portable data acquisition system.
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High-Speed Acquisition and Analysis of Scattering Nanoparticle Light Signals
Acquiring scattering light signals from photons to analyze the size of nanoparticles.
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Building a Real-Time Multichannel Modem Test Bed Using NI LabVIEW and PXI
Building a prototype of a multichannel wired communication system using discrete multitone (DMT) modulation and commercial off-the-shelf (COTS) components for system designers to evaluate communication performance and computational complexity trade-offs.
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EUtech Reduces Coal Power Plant Emissions Using NI Hardware and Software
Creating a mobile data acquisition and control system for a laser-based probe to measure coal particles in coal pipes under severe operating conditions, which helps optimize coal combustion efficiency and lessen the effects of coal burning on the environment by reducing greenhouse gases such as
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Designing a Medical Ultrasound Test System with NI Hardware and Software
Replacing an aging functional test platform based on VXI architecture to automate the functional testing of medical ultrasound systems for transmitter, receiver, and frequency response as well as distortion testing.
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Performing On-Wafer Testing with NI LabVIEW, NI TestStand, and PXI
Developing a reliable on-wafer test system for microelectromechanical system (MEMS) devices used for cardiac resynchronization therapy (CRT).
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Advanced Cancer Research Using Next-Generation Medical Imaging with PXI Modular Instrumentation and NI LabVIEW
Creating a medical instrument that can detect cancer during medical checkups by improving on traditional methods that do not provide sufficient resolution or require the patient to undergo severe stress during the checkup.
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Credence Systems Uses NI Modular Instruments to Extend Semiconductor Test Flexibility
Creating a test solution that performs specialized high-frequency measurements to meet diverse semiconductor application needs.
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Tests short-circuits at hundreds of kVolts using PXI
Upgrade an existing test system for use in safety and certification tests, for equipment to be used in the distribution and transmission network of utilities all over the world. These devices are tested for faults under high power conditions, up to 8000 MVA 3 phase 50 Hz (1060 kV peak at 63 kA).
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