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Managing Multiple Types of DSP Processors Using NI TestStand
Developing a test solution that combines structural and functional tests and delivers high throughput, real-time test results, and data upload into MfG/PRO/Oracle to support multiple families of DSP processor modules.
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Realisation of ATE – LASAR Translator using PXI Architecture and TestStand
Developing a low-cost digital test system with an open architecture that has the ability to leverage test procedures already created for traditional digital testers
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Designing High-Speed Digital Tests for Military Defense Systems
Developing a high-channel-count digital test system with an open architecture that can leverage existing digital test patterns created for traditional digital instruments.
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Using NI LabVIEW and PXI Modular Instruments for Automated Chip Characterization and Validation
Developing a flexible test system to automatically characterize an integrated circuit under varying conditions.
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Automation of Chemical Beam Epitaxial Wafer Manufacturing
Implementing several enhancements to process control, monitoring, hardware configuration, user interface, and data logging features of control software in modern wafer growth facilities.
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Research Group Creates Flexible, High-Speed, Mixed-Signal System for On-Wafer Function and Performance Testing
Developing a custom mixed-signal measurement platform that can accommodate multiple power supplies and high-speed digital and analog signals for on-wafer measurement of devices and prototype circuits.
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Control System for Automated Production of Semiconductors
Creating a graphical user interface for an automated holographic mask aligner and developing the interface in a condensed time period while considering safety issues, such as emergency stop, general error handling and status lamps.
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