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F-RAM Memory Validation and Debugging with NI PXI and Modular Instruments
Creating a flexible, cost-effective ferroelectric RAM (F-RAM) memory test system as an alternative to existing automated test equipment (ATE) for functional verification of new products and quick diagnosis of problematic memory units returned by customers.
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Automated Characterization of Analog-to-Digital Converters Using PXI, LabVIEW, and DIAdem
Replacing existing benchtop equipment with a fully automatic measurement system to accurately characterize analog-to-digital converters (ADCs) to improve quality, reduce costs, and shorten test development time.
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Automated Resistance Mapping of LGA Chip Module Contact Grid
Verifying uniform force distribution and quality of electrical connectivity on a pressurized land grid array (LGA) interposer and automating a time-consuming and physically prohibitive process involving substantial measurement, data recording, and data presentation.
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Managing Multiple Types of DSP Processors Using NI TestStand
Developing a test solution that combines structural and functional tests and delivers high throughput, real-time test results, and data upload into MfG/PRO/Oracle to support multiple families of DSP processor modules.
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Designing High-Speed Digital Tests for Military Defense Systems
Developing a high-channel-count digital test system with an open architecture that can leverage existing digital test patterns created for traditional digital instruments.
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Research Group Creates Flexible, High-Speed, Mixed-Signal System for On-Wafer Function and Performance Testing
Developing a custom mixed-signal measurement platform that can accommodate multiple power supplies and high-speed digital and analog signals for on-wafer measurement of devices and prototype circuits.
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Using NI LabVIEW and PXI Modular Instruments for Automated Chip Characterization and Validation
Developing a flexible test system to automatically characterize an integrated circuit under varying conditions.
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