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Qualcomm Atheros Improves WLAN Test Speed and Coverage Using the NI PXI Vector Signal Transceiver and NI LabVIEW

With traditional instrumentation, approximately 40 points of meaningful WLAN transceiver data were collected per iteration. The speed increase of the NI PXI vector signal transceiver triggered full gain table sweeps to acquire all 300,000 points.

"Using the software-designed NI PXI vector signal transceiver and the NI WLAN Measurement Suite, we improved test speeds by more than 200 times compared to traditional rack-and-stack instruments while significantly improving test coverage."

- Doug Johnson, Qualcomm Atheros

The Challenge:
Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards.

The Solution:
Using the NI PXI-based vector signal transceiver and the NI LabVIEW FPGA Module to create a customized, flexible WLAN test system that delivers a 200X reduction in test time compared to previous rack-and-stack instruments, resulting in lower test costs and better device characterization.

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