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ST-Ericsson Reduces Semiconductor Test Time 10X Using LabVIEW and NI PXI RF Instruments

Figure 1. ST-Ericsson Transceiver

"Overall, the PXI system was ten times faster and three times less expensive than the previous solution. The PXI platform also provided the flexibility needed to adapt to all the different digital and RF standards."

- Sylvain Bertrand, ST-Ericsson

The Challenge:
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.

The Solution:
Replacing bulky, expensive, and inflexible boxed instruments with the software-defined NI PXI platform.

Read the Full Case Study

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