使用PXI模块化仪器完成超低功耗ASIC设计的结构和内存测试

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"我们已使用PXI Express自动测试系统完成多个项目,并获得非常满意的效果。自动测试系统大大减少了芯片测试的时间,而其快速、准确的直流测试更是实验室的宝贵财富。"

- Mario Konijnenburg, Holst Centre/imec

The Challenge:
创建灵活的测试系统用于自动验证和表征新的超低功耗半导体芯片设计。

The Solution:
使用NI LabVIEW软件和NI PXI Express高速数字I/O设备开发自动测试系统,前者读取测试向量,后者产生和接收数字数据,并同时以很高的精度测量芯片设计的直流损耗。

Author(s):
Mario Konijnenburg - Holst Centre/imec

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